Search results for "Spectroscopic ellipsometry"
showing 4 items of 4 documents
Optical Gradient of the Trapezium-Shaped NaNbO[sub 3] Thin Films Studied by Spectroscopic Ellipsometry
2008
thin films were performed in the photon energy range of 1.24–4.96 eV.Effective values of the complex refractive index and thickness nonuniformity, roughness, and depth profile of the real part of therefractive index were evaluated. An increase of the refractive index with increasing of the sample thickness was observed anddiscussed.© 2008 The Electrochemical Society. DOI: 10.1149/1.2965786 All rights reserved.Manuscript submitted May 27, 2008; revised manuscript received July 7, 2008. Published August 19, 2008.
Porous Aluminium Oxide Coating for the Development of Spectroscopic Ellipsometry Based Biosensor: Evaluation of Human Serum Albumin Adsorption
2020
An electrochemically synthesised porous anodic aluminium oxide (pAAO) layer has been analysed by means of spectroscopic ellipsometry. The determined thickness of the formed pAAO layer obtained from spectroscopic ellipsometry measurements and modelling was 322.75 ±
Experimental characterization of micromechanical and microphological properties of nickel base alloys strained by the growth of an ovide payer made i…
2011
The loss of the corrosion resistance of the alloy 600, a nickel base alloy, during the oxidation in pressurized water reactor (PWR) has been demonstrated by many studies. It induces the intergranular stress corrosion cracking (IGSCC). If the chemical composition and the structure of the growing oxide are well-known, the mechanical influence of the oxide on the alloy has not been fully studied, yet. This study aims at bringing new knowledge of the oxidation impact on the mechanical response of the alloy. A new methodology is introduced for determining the local nanodeformation of the alloy 600 induced either by an oxidation or by a tensile loading. This method is based on nanodots disposed a…
Thermo-optical studies of NaNbO3thin films
2007
Thermo-optical studies of sodium niobate NaNbO3 (NN) thin films, deposited by the pulsed laser ablation technique on Si/SrRuO3 substrates, were performed by spectroscopic ellipsometry in the temperature range 300-550°C. Optical constants at the room temperature were measured in the spectral range 250-1000 nm. Substantial changes in the refractive index temperature behaviour (taken at λ = 300 nm) were found at temperatures 370, 445, 503, 520, and 532°C, where the first and the last temperatures are the phase transitions P → R and S → T1, respectively. Other temperatures (445, 503, and 520°C) are suggested as the points of some local structural changes in the NN film.